Products - Sinetec Technologies
Protocol Analyzers and Exercisers -PCIe 1.0 Probing Solutions
Product Description
N5315A slot interposer probe for PCIe 1.0 and PCIe 2.0
The Agilent N5315A provides the ability to probe on the PCIe® standard card edge form-factor at all link widths; x1, x4, x8 and x16. The N5315A uses an analog repeating design that does not distort the signal that it is probing. It also ensures that electrical idle signals are propagated correctly through the probe. The slot interposer is designed with mechanical stabilization for both the end point and with the backplane to ensure firm PCIe slot connections. Compatible with N5306A PCIe Analyzer Module PCIe Probes for Agilent E2960B - brochure
Key Features & Specifications Analog repeating slot interposer Physical link width x1 x4 x8 x16 Elec
The Agilent N5328A Soft touch probe increases the flexibility of the N5306A analyzer by enabling a direct connection from the probe to an embedded PCIe® bus even on designs with space constraints. At half the size of the N4241A the N5328A will be a key component in new system designs. With the N5328A soft touch probe for PCIe, engineers are able to analyze the PCIe bus communication without influencing the signals. The soft touch probe utilizes micro spring-pin technology to provide a reliable connection to the signal pads without the need for special cleaning or special surface finishes of the probe pads.
N4241A Soft Touch Probe for PCIe 1.0 and PCIe 2.0
The Agilent N4241A, N4242A and N4243A Soft touch probe increases the flexibility of the N5306A analyzer by enabling a direct connection from the probe to an embedded PCIe® bus on any system design. With the N4241A soft touch probe for PCIe, engineers are able to analyze the PCIe bus communication without influencing the signals. The soft touch probe utilizes micro spring-pin technology to provide a reliable connection to the signal pads without the need for special cleaning or special surface finishes of the probe pads. Different configurations of the probe are provided (both straight N4241A and swizzled N4242A) to deal with layout considerations on the board. A split probe (N4243A) is also available to monitor 2 x4 links from a single foot print.
N4241F PCIe Gen2 Flying Leads Probe for embedded PCIe 2.0
The PCIe Gen2 Flying Leads probe makes it possible to access PCIe Gen 2 links with no integrated connectors, at rates of both 2.5 GT/s and 5.0 GT/s. With very low capacity loading, the probe enables you to monitor the PCIe protocol in space constraint designs, without influencing the monitored signals. Agilent provides a unique probe portfolio for PCIe 2.0, including the midbus probe, slot interposer probe and now the new Flying Leads probe.
N4241Z PCIe Gen2 ZIF Flying Leads Probe for embedded PCIe 2.0
At PCIe® 2.0 speeds, reliable probing becomes even more important. Without a reliable probing solution and the right form-factor, reliable data capture becomes difficult if not impossible. With the new ZIF flying leads probe from Agilent, the same ZIF tip soldering point can be used with the Oscilloscope for physical layer measurements or with the protocol analyzer to debug logic level problems. Agilent provides an industry-unique probe portfolio for PCIe 2.0, including the full size mid-bus probe (straight, swizzle and split styles available), half size mid-bus probe, slot interposer probe, flying leads probe and now the ZIF flying leads probe. PCI Express Probe for Agilent E2960B - Brochure PCI Express and PCIe are registered trademarks of PCI-SIG.